共 50 条
- [41] SHADOW PROJECTION MASK FOR X-RAY, ION AND ELECTRON BEAM LITHOGRAPHY. [J]. IBM technical disclosure bulletin, 1983, 26 (7 A):
- [42] Evaluation of performance of proximity effect correction in electron projection lithography [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5535 - 5539
- [43] Predicting overlay performance for electron-projection-lithography masks [J]. JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS, 2003, 2 (02): : 148 - 156
- [44] Semiconductor on glass photocathodes as high-performance sources for parallel electron beam lithography [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 3782 - 3786
- [45] High-performance resist materials for ArF excimer laser and electron beam lithography [J]. FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 2002, 38 (01): : 3 - 12
- [46] Semiconductor on glass photocathodes as high-performance sources for parallel electron beam lithography [J]. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1996, 14 (06): : 3782 - 3786
- [47] Modeling of Projection Electron Lithography [J]. EMERGING LITHOGRAPHIC TECHNOLOGIES IV, 2000, 3997 : 245 - 254
- [48] Electron beam damage in the SiN membrane of an X-ray lithography mask [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (01): : 360 - 363
- [49] Electron beam damage in the SiN membrane of an X-ray lithography mask [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (01): : 360 - 363
- [50] Proximity lithography membrane mask aeroelasticity [J]. EMERGING LITHOGRAPHIC TECHNOLOGIES X, PTS 1 AND 2, 2006, 6151 : U1402 - U1411