Observation of amorphous recording marks using reflection-mode near-field scanning optical microscope supported by optical interference method

被引:3
|
作者
Sakai, M
Mononobe, S
Yusu, K
Tadokoro, T
Saiki, T
机构
[1] KAST, Near Field Opt Grp, Takatsu Ku, Kawasaki, Kanagawa 2310012, Japan
[2] Toshiba Co Ltd, Ctr Corp Res & Dev, Saiwai Ku, Kawasaki, Kanagawa 2128582, Japan
[3] Techno Synergy Inc, Hachioji, Tokyo 1930832, Japan
[4] Keio Univ, Dept Elect & Elect Engn, Kohoku Ku, Yokohama, Kanagawa 2238522, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 9A期
关键词
near-field scanning optical microscope; illumination-collection mode; aperture probe; optical interference; high resolution; high contrast; rewritable HD DVD; recording mark;
D O I
10.1143/JJAP.44.6855
中图分类号
O59 [应用物理学];
学科分类号
摘要
A signal enhancing technique for a reflection-mode near-field scanning optical microscope (NSOM) is proposed. Optical interference between the signal light, from an aperture at the tip of a tapered optical fiber, and the reflected light, from a metallic coating around the aperture, enhances the signal intensity. We used a rewritable high-definition digital versatile disc (HD DVD) with dual recording layers as a sample medium, and demonstrated observation of amorphous recording marks on the semitransparent (the first) recording layer. In spite of low optical contrast between the crystal region and the amorphous region on this layer,,we successfully observed recording marks with good contrast.
引用
收藏
页码:6855 / 6858
页数:4
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