Simultaneous reflection and transmission modes near-field scanning optical microscope

被引：2
|
作者：
Wei, PK [1 ]
Wei, CC [1 ]
Hsu, JH [1 ]
Fann, WS [1 ]
机构：
[1] NATL TAIWAN UNIV,DEPT PHYS,TAIPEI 10764,TAIWAN
来源：
ULTRAMICROSCOPY | 1995年 / 61卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(95)00109-3
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A near-field optical microscope operated simultaneously in reflection and transmission modes is demonstrated. A low noise, large area Si photodetector was mounted directly between the PZT scanning stage and the sample for the transmission measurement. In reflection mode, either a PMT or two large area Si detectors were used for the signal collection. In addition, a simple method for measuring the actual vibrational amplitude in the shear force microscope was also discussed.
引用
收藏
页码：237 / 239
页数：3
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