Molecular dynamics simulation of Argon-atom bombardment on graphene sheets

被引：0

作者：

Wei, Xiao-Lin ^{[1
,2
]}

Zhang, Kai-Wang ^{[1
,2
]}

Wang, Ru-Zhi ^{[3
]}

Liu, Wen-Liang ^{[1
,2
]}

Zhong, Jian-Xin ^{[1
,2
]}

机构：

[1] Xiangtan Univ, Dept Phys, Xiangtan 411105, Hunan, Peoples R China

[2] Xiangtan Univ, Lab Quantum Engn & Micro Nano Energy Technol, Xiangtan 411105, Hunan, Peoples R China

[3] Beijing Univ Technol, Coll Mat Sci & Engn, Lab Thin Film Mat, Beijing 100124, Peoples R China

来源：

INEC: 2010 3RD INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1 AND 2 | 2010年

关键词：

CARBON; GAS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

By a molecular dynamics method and using different incident energy and particle density, we calculated the Argon-atom bombardment on a graphene sheet. The results show that, the damage of the bombardment on the graphene sheet depends not only on the incident energy but also on the particle density of Argon atoms. To compare and analyze the effect of the incident energy and the particle density in the Argon-atom bombardment, we defined the impact factor on graphene sheet of the incident energy and the particle density by analyzing the structural Lindeman- index and calculating the broken-hole area of the sheet, respectively. The results indicate that, there is a critical incident energy and particle density for destroying the graphene sheet, and there is an exponential accumulated-damage for the impact of both the incident energy and the particle density in Argon-atom bombardment on a graphene sheet. Our results supply some valuable mechanics parameters for fabrication of potential graphene-based electronic devices with high particle radiation.

引用

页码：566 / +

页数：2

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