SoC-Level Safety-Oriented Design Process in Electronic System Level Development Environment

被引:0
|
作者
Lu, Kuen-Long [1 ]
Chen, Yung-Yuan [2 ]
机构
[1] Natl Taipei Univ, Coll Elect Engn & Comp Sci, 151 Univ Rd, New Taipei 23741, Taiwan
[2] Natl Taipei Univ, Dept Elect Engn, 151 Univ Rd, New Taipei 23741, Taiwan
关键词
FMEA; ISO; 26262; electronic system level; fault injection; safety-oriented design process; SoC; SystemC; SOFT ERRORS; VERIFICATION; SIMULATION; MICROPROCESSOR; RELIABILITY; REDUNDANCY; FAULTS;
D O I
10.1142/S0218126621502546
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We propose a safety-oriented design process for IP-based safety-critical system-on-chip (SoC). The proposed safety process can facilitate the measurement of the robustness based on the safety-related metrics and scales of failure-induced risks in a system that can be employed to locate the critical components for protection to effectively diminish the influence of failures on the system. The risk reduction phase is activated to enhance the robustness of critical components identified by vulnerability analysis if the measured robustness is insufficient. An SoC-level safety design platform was built on the SystemC Synopsys Platform Architect MCO to demonstrate the core idea of the safety process. The safety-oriented design process for an ARM-embedded SoC modeled at the TLM level was conducted to demonstrate the feasibility of our safety approach.
引用
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页数:38
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