Measurement and Management of the Level of Quality Control Process in SoC (System on Chip) Embedded Software Development

被引:1
|
作者
Song, Ki-won [2 ]
Kim, Jin-soo [1 ]
机构
[1] Konyang Univ, Nonsan, South Korea
[2] Samsung Elect Co Ltd, Syst LSI Div, SW Solut Develop Team, Hwasung City, Gyunggi Do, South Korea
关键词
Quality Measurement; Quality Process; Quality Metrics; KPI;
D O I
10.5772/45642
中图分类号
TP24 [机器人技术];
学科分类号
080202 ; 1405 ;
摘要
This paper presents the process of measuring the level of quality control process to ensure the quality of delivered software package during the development cycle. The success of the project requires three prerequisites and they constrain one another. Quality is the most important factor for successful project completion. In other words, quality should not be sacrificed for the sake of meeting cost budget or delivering within schedule. Also, cost caused by any quality issues such as defect resolution increases exponentially once the product is out of the door. Having said that, we also have to consider the schedule side of constraints for the successful project. In other words, we have no time to do a quality job and we have to compete with other competitors to ship the product to the market earlier than them. So, the quality measurement and management concept is introduced to meet the agile software development environment in conjunction with performance strategies to execute within organization. Obviously, there are many key performance indexes derivable from the actual data associated with quality control activities and it is desirable to create a quality process to integrally represent overall level of quality control activities performed while developing the software deliverables. With the quality process, it is possible to evaluate whether enough quality control activities are performed for the project officially and secure the quality of the software deliverables before it is delivered to the customers.
引用
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页数:7
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