Sensitivity Enhancement for Low-Coherence Interferometry

被引:3
|
作者
Benitez, J. [1 ]
Mora, J. [1 ]
机构
[1] Univ Politecn Valencia, ITEAM Res Inst, E-46022 Valencia, Spain
关键词
Low coherence interferometry; microwave photonics; optical profile; phase modulation; sensitivity; TOMOGRAPHY; MODULATION;
D O I
10.1109/LPT.2017.2748818
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this letter, a sensitivity improvement for systems combining low-coherence interferometry (LCI) and microwave photonics (MWP) is demonstrated. This improvement is due to the introduction of a different modulation format and an exhaustive control of the optical source profile compared with previous MWP-LCI schemes. Our proposal allows to retrieve the visibility of low-coherence interferograms through the analysis of the interference pattern using a dispersive element. We demonstrate that the use of a phase modulator offers better stability and lower insertion loss since a bias point configuration is not needed compared with the intensity modulators typically used in these schemes. The process for controlling the optical source profile permits a comparison between uniform and Gaussian profiles. In this way, the limiting effects of the sidelobes over the achieved sensitivity level are analyzed. The proposed MWP-LCI structure is experimentally demonstrated through the characterization of the electrical transfer function. In this case, a maximum sensitivity of 65 dB is achieved in our MWP-LCI structure showing a 30-dB improvement compared with current proposals.
引用
收藏
页码:1735 / 1738
页数:4
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