Strain Profiling of a Ferritic-Martensitic Stainless Steel Sheet - Comparing Synchrotron with Conventional X-Ray Diffraction

被引：3
|
作者：
Olsson, C. -O. A. [1 ]
Bostrom, M. [1 ]
Buslaps, T. [2 ]
Steuwer, A. [3 ,4 ]
机构：
[1] Sandvik Mat Technol, SE-81181 Sandviken, Sweden
[2] European Synchrotron Radiat Facil, FR-38042 Grenoble, France
[3] Lund Univ, MAX Lab 4, SE-22100 Lund, Sweden
[4] NMMU, ZA-6031 Port Elizabeth, South Africa
来源：
STRAIN | 2015年 / 51卷 / 01期
关键词：
stainless steel; stress profile; synchrotron; tumbling; RESIDUAL-STRESS;
D O I：
10.1111/str.12121
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
To improve the fatigue resistance of stainless steel sheet, it is a common practice to induce compressive residual stress in the surface through shot-peening or tumbling. Stress depth profiles obtained by tumbling of thin stainless steel tensile rods were analysed using laboratory and synchrotron X-Ray Diffraction (XRD). Both the non-destructive synchrotron and the laboratory XRD etch-depth profile gave similar results: a residual stress profile decaying over a depth not exceeding 50 mu m into the material.
引用
收藏
页码：71 / 77
页数：7
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