Strain Profiling of a Ferritic-Martensitic Stainless Steel Sheet - Comparing Synchrotron with Conventional X-Ray Diffraction

被引：3

作者：

Olsson, C. -O. A. ^{[1
]}

Bostrom, M. ^{[1
]}

Buslaps, T. ^{[2
]}

Steuwer, A. ^{[3
,4
]}

机构：

[1] Sandvik Mat Technol, SE-81181 Sandviken, Sweden

[2] European Synchrotron Radiat Facil, FR-38042 Grenoble, France

[3] Lund Univ, MAX Lab 4, SE-22100 Lund, Sweden

[4] NMMU, ZA-6031 Port Elizabeth, South Africa

来源：

STRAIN | 2015年 / 51卷 / 01期

关键词：

stainless steel; stress profile; synchrotron; tumbling; RESIDUAL-STRESS;

D O I：

10.1111/str.12121

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

To improve the fatigue resistance of stainless steel sheet, it is a common practice to induce compressive residual stress in the surface through shot-peening or tumbling. Stress depth profiles obtained by tumbling of thin stainless steel tensile rods were analysed using laboratory and synchrotron X-Ray Diffraction (XRD). Both the non-destructive synchrotron and the laboratory XRD etch-depth profile gave similar results: a residual stress profile decaying over a depth not exceeding 50 mu m into the material.

引用

页码：71 / 77

页数：7

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