THz near-field imaging and spectroscopy with nanoscale resolution

被引：0
|
作者：
Reich, Aina [1 ]
Eisele, Max [1 ]
Huber, Andreas [1 ]
机构：
[1] Ineaspec GmbH, D-82152 Martinsried, Germany
来源：
2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2018年
关键词：
GRAPHENE PLASMONS; TERAHERTZ; MICROSCOPE; DETECTOR; PROBE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Scattering-type near-field microscopy can overcome the limits in spatial resolution present in conventional THz imaging and spectroscopy techniques. This talk shows how THz near-field imaging and THz-TDS with a spatial resolution <20 nm can be realized with our neaSNOM microscope and some of the possible applications.
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页数：3
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