Subwavelength-resolution near-field Raman spectroscopy

被引：0
|
作者：
S. S. Kharintsev
G. G. Hoffmann
J. Loos
G. de With
P. S. Dorozhkin
M. Kh. Salakhov
机构：
[1] Kazan State University,Institute of Solid
[2] Eindhoven University of Technology,State Physics
[3] University of Duisburg-Essen,undefined
[4] Russian Academy of Sciences,undefined
来源：
Journal of Experimental and Theoretical Physics | 2007年 / 105卷
关键词：
42.62.Fi; 42.65.-k; 42.65.An;
D O I：
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中图分类号：
学科分类号：
摘要：
The resolution capabilities of near-field Raman spectroscopy based on a giant enhancement of the electric field near a nanosized metal probe are studied. As a test sample, bundles of single-walled carbon nanotubes deposited on glass substrates are used. It is shown that this method ensures a subwavelength spatial resolution of about 50 nm and demonstrates a Raman scattering enhancement of the order of 104.
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页码：909 / 915
页数：6
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