Reflection of X-Rays from Rough Profiled Surface

被引：0
|
作者：
Gaevsky, O. Yu [1 ]
Molodkin, V. B.
Nosik, V. L.
机构：
[1] Natl Acad Sci Ukraine, GV Kurdyumov Inst Metallophys, UA-03680 Kiev, Ukraine
来源：
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 2010年 / 32卷 / 12期
关键词：
TOTAL EXTERNAL REFLECTION; SCATTERING; DIFFRACTION;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Reflection of x-rays from periodic lateral surfaces characterised by large-scale one-dimensional profile and fine-scale roughnesses is analysed. Within the Kirchhoff's approximation, when the large-scale surface irregularities are represented by locally flat sections, analytical expressions for coherent-scattering cross-section are obtained. For modelling profiles, dependences of reflexion intensity on an angle of observation and reflectance for mirror and non-mirror peaks are obtained.
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页码：1613 / 1623
页数：11
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