Reflection of X-Rays from Rough Profiled Surface

被引：0

作者：

Gaevsky, O. Yu ^{[1
]}

Molodkin, V. B.

Nosik, V. L.

机构：

[1] Natl Acad Sci Ukraine, GV Kurdyumov Inst Metallophys, UA-03680 Kiev, Ukraine

来源：

METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 2010年 / 32卷 / 12期

关键词：

TOTAL EXTERNAL REFLECTION; SCATTERING; DIFFRACTION;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Reflection of x-rays from periodic lateral surfaces characterised by large-scale one-dimensional profile and fine-scale roughnesses is analysed. Within the Kirchhoff's approximation, when the large-scale surface irregularities are represented by locally flat sections, analytical expressions for coherent-scattering cross-section are obtained. For modelling profiles, dependences of reflexion intensity on an angle of observation and reflectance for mirror and non-mirror peaks are obtained.

引用

页码：1613 / 1623

页数：11

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