Active damping by Q-control for fast force-distance curve measurements in atomic force microscopy

被引：7
|
作者：
Kohl, D. [1 ]
Kerschner, C. [1 ]
Schitter, G. [1 ]
机构：
[1] Vienna Univ Technol, Automat & Control Inst ACIN, Gusshausstr 27-29-E376, A-1040 Vienna, Austria
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 12期
关键词：
SPEED; AFM; DESIGN; LIQUID;
D O I：
10.1063/1.4991604
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This paper investigates the benefit of active damping by an analog Q-control circuit for measuring fast force-distance curves in atomic force microscopy. By active damping of the cantilever oscillation after snap-off, the down-ring time-constant is reduced significantly from 385 mu s to 23 mu s. Experimental results demonstrate that the number of force-distance curves per second can be increased by a factor of more than 30. Published by AIP Publishing.
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收藏
页数：5
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