共 50 条
- [42] Tribology in CMP processes: Material removal mechanism in CMP processes [J]. J Jpn Soc Tribol, 2009, 2 (109-115): : 109 - 115
- [43] Occurrence of 'accidental' InN quantum dots in indium gallium nitride/gallium nitride heterostructures [J]. QUANTUM CONFINED SEMICONDUCTOR NANOSTRUCTURES, 2003, 737 : 13 - 17
- [45] Nanocrystalline gallium nitride from gallium azide precursors [J]. SURFACE-CONTROLLED NANOSCALE MATERIALS FOR HIGH-ADDED-VALUE APPLICATIONS, 1998, 501 : 15 - 20
- [48] Material removal mechanisms of oxide and nitride CMP with celia and silica-based slurries - Analysis of slurry particles pre- and post-dielectric CMP [J]. ADVANCES IN CHEMICAL-MECHANICAL POLISHING, 2004, 816 : 257 - 268
- [49] Development of accurate prediction technology of material removal rate distribution in planarization CMP [J]. 2018, Japan Society for Precision Engineering (84):
- [50] Gallium oxide buffer layers for gallium nitride epitaxy [J]. OPTICA APPLICATA, 2013, 43 (01) : 73 - 79