共 50 条
- [1] Mask etcher data strategy for 45nm and beyond PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XIII, PTS 1 AND 2, 2006, 6283
- [3] High transmission mask technology for 45nm node imaging OPTICAL MICROLITHOGRAPHY XIX, PTS 1-3, 2006, 6154 : U574 - U583
- [4] High transmission mask technology for 45nm node imaging Optical Microlithography XVIII, Pts 1-3, 2005, 5754 : 349 - 354
- [5] High transmission mask technology for 45nm node imaging OPTICAL MICROLITHOGRAPHY XIX, PTS 1-3, 2006, 6154 : U471 - U480
- [6] Process window optimization of CPL mask for beyond 45nm lithography OPTICAL MICROLITHOGRAPHY XX, PTS 1-3, 2007, 6520
- [7] EUV mask blank readiness for 45nm HP 2009 manufacturing Emerging Lithographic Technologies IX, Pts 1 and 2, 2005, 5751 : 178 - 189
- [8] Mask repair technique assessment and development for the 45nm lithographic node PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XIII, PTS 1 AND 2, 2006, 6283
- [9] Distributed computing in mask data preparation for 45nm node and below PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2, 2006, 6349