Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy

被引：5
|
作者：
Higuchi, T [1 ]
Tsukamoto, T
Hattori, T
Honda, Y
Yokoyama, S
Funakubo, H
机构：
[1] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan
[2] Tokyo Inst Technol, Dept Innovat & Engn Mat, Yokohama, Kanagawa 2268502, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 9B期
关键词：
PZT; PLZT; thin film; X-ray absorption spectroscopy (XAS); soft-X-ray emission spectroscopy (SXES); electronic structure; hybridization effect;
D O I：
10.1143/JJAP.44.6923
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The electronic structure of (Pb,La)(Zr,Ti)O-3 (PLZT) thin film was studied by X-ray absorption spectroscopy and soft-X-ray emission spectroscopy (SXES). The Ti 3d and O 2p partial densities of states in the valence band region were observed in O 1 s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of PLZT thin film is lower than that of Pb(Zr,Ti)O-3 thin film. This finding indicates that the hybridization effect is closely related to the change in the bond length between Ti and O ions.
引用
收藏
页码：6923 / 6926
页数：4
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