Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy

被引：5

作者：

Higuchi, T ^{[1
]}

Tsukamoto, T

Hattori, T

Honda, Y

Yokoyama, S

Funakubo, H

机构：

[1] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan

[2] Tokyo Inst Technol, Dept Innovat & Engn Mat, Yokohama, Kanagawa 2268502, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 9B期

关键词：

PZT; PLZT; thin film; X-ray absorption spectroscopy (XAS); soft-X-ray emission spectroscopy (SXES); electronic structure; hybridization effect;

D O I：

10.1143/JJAP.44.6923

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electronic structure of (Pb,La)(Zr,Ti)O-3 (PLZT) thin film was studied by X-ray absorption spectroscopy and soft-X-ray emission spectroscopy (SXES). The Ti 3d and O 2p partial densities of states in the valence band region were observed in O 1 s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of PLZT thin film is lower than that of Pb(Zr,Ti)O-3 thin film. This finding indicates that the hybridization effect is closely related to the change in the bond length between Ti and O ions.

引用

页码：6923 / 6926

页数：4

共 50 条

[1] Electronic structure in the valence band of (Pb,La)(Zr,Ti)O3 thin films probed by soft-X-ray emission spectroscopy
Higuchi, Tohru
Tsukamoto, Takeyo
Hattori, Takeshi
Honda, Yoshihisa
Yokoyama, Shintaro
Funakubo, Hiroshi
TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 31, NO 1, 2006, 31 (01): : 23 - +
[2] Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy
Higuchi, Tohru
Tanaka, Masashi
Kudoh, Kazuhide
Takeuchi, Tomoyuki
Harada, Yoshihisa
Shin, Shik
Tsukamoto, Takeyo
2001, Japan Society of Applied Physics (40):
[3] Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy
Higuchi, T
Tanaka, M
Kudoh, K
Takeuchi, T
Harada, Y
Shin, S
Tsukamoto, T
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (9B): : 5803 - 5805
[4] Electronic structure of La1-xSrxScO3 probed by soft-x-ray absorption spectroscopy
Higuchi, T.
Nagao, Y.
Liu, J.
Iguchi, F.
Sata, N.
Hattori, T.
Yugami, H.
JOURNAL OF APPLIED PHYSICS, 2008, 104 (07)
[5] Electronic structure of c-axis controlled α-Fe2O3 thin film probed by soft-X-ray spectroscopy
Kawamura, Kinya
Suzuki, Naoya
Tsuchiya, Takashi
Yamaguchi, Shohei
Ochi, Masanori
Suetsugu, Takaaki
Minohara, Makoto
Kobayashi, Masaki
Horiba, Koji
Kumigashira, Hiroshi
Higuchi, Tohru
JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (06)
[6] Electronic structure of ferroelectric material probed by soft-X-ray spectroscopy
Higuchi, T.
2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2, 2007, : 255 - 258
[7] (Pb, La)(Zr, Ti)O3 thin film arrayed waveguide grating
Yasumoto, Mitsuhiro
Suzuki, Takanori
Tsuda, Hiroyuki
Rai, Madhan
Kudzuma, David
Dawley, Jeff
Ritums, Dwight
Tanaka, Yuki
LaBuda, Mitch
Nashimoto, Keiichi
2006 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2006, : 961 - +
[8] Dynamics of polarization loss in (Pb, La)(Zr, Ti)O3 thin film capacitors
Jenkins, I.G.
Song, T.K.
Madhukar, S.
Prakash, A.S.
Aggarwal, S.
Ramesh, R.
Applied Physics Letters, 1998, 72 (25):
[9] Electronic structure of protonic conductor SrTi0.98SC0.02O3 probed by soft-X-ray spectroscopy
Higuchi, T
Yamaguchi, S
Shin, S
Hattori, T
Tsukamoto, T
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (1A): : 285 - 286
[10] Electronic structure of protonic conductor BaCe0.90Y0.10O3-δ probed by soft-X-ray spectroscopy
Higuchi, T
Matsumoto, H
Shimura, T
Yashiro, K
Kawada, T
Mizusaki, J
Shin, S
Tsukamoto, T
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (6A): : L731 - L734

← 1 2 3 4 5 →