Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy

被引：0
|
作者：
Higuchi, Tohru [1 ]
Tanaka, Masashi [1 ]
Kudoh, Kazuhide [1 ]
Takeuchi, Tomoyuki [1 ]
Harada, Yoshihisa [2 ]
Shin, Shik [2 ,3 ]
Tsukamoto, Takeyo [1 ]
机构：
[1] Department of Applied Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan
[2] RIKEN, Sayo-gun, Hyogo 679-5148, Japan
[3] Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
来源：
| 2001年 / Japan Society of Applied Physics卷 / 40期
关键词：
D O I：
10.1143/jjap.40.5803
中图分类号：
学科分类号：
摘要：
17
引用
收藏
相关论文
共 50 条
  • [1] Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy
    Higuchi, T
    Tanaka, M
    Kudoh, K
    Takeuchi, T
    Harada, Y
    Shin, S
    Tsukamoto, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (9B): : 5803 - 5805
  • [2] Electronic structures of Bi4Ti3O12 thin film and single crystal determined by resonant soft-x-ray emission spectroscopy
    Higuchi, T
    Kudoh, K
    Takeuchi, T
    Masuda, Y
    Harada, Y
    Shin, S
    Tsukamoto, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (11B): : 7195 - 7197
  • [3] Electronic structure in valence band of Nd-substituted Bi4Ti3O12 single crystal probed by soft-X-ray emission spectroscopy
    Higuchi, T
    Noguchi, Y
    Goto, T
    Miyayama, M
    Shin, S
    Kaneda, K
    Hattori, T
    Tsukamoto, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2005, 44 (46-49): : L1491 - L1493
  • [4] Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy
    Higuchi, T
    Tsukamoto, T
    Hattori, T
    Honda, Y
    Yokoyama, S
    Funakubo, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (9B): : 6923 - 6926
  • [5] Ferroelectric distortion and electronic structure in Bi4Ti3O12
    Noguchi, Yuji
    Goto, Takashi
    Miyayama, Masaru
    Hoshikawa, Akinori
    Kamiyama, Takashi
    JOURNAL OF ELECTROCERAMICS, 2008, 21 (1-4) : 49 - 54
  • [6] Electronic structure in the valence band of (Pb,La)(Zr,Ti)O3 thin films probed by soft-X-ray emission spectroscopy
    Higuchi, Tohru
    Tsukamoto, Takeyo
    Hattori, Takeshi
    Honda, Yoshihisa
    Yokoyama, Shintaro
    Funakubo, Hiroshi
    TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 31, NO 1, 2006, 31 (01): : 23 - +
  • [7] Ferroelectric distortion and electronic structure in Bi4Ti3O12
    Yuji Noguchi
    Takashi Goto
    Masaru Miyayama
    Akinori Hoshikawa
    Takashi Kamiyama
    Journal of Electroceramics, 2008, 21 : 49 - 54
  • [8] Bi4Ti3O12 ferroelectric thin film ultraviolet detectors
    Appl Phys Lett, 3 (342):
  • [9] Nanocrystalline Bi4Ti3O12 thin film for pressure sensor
    Wei, CC
    Yahaya, M
    Salleh, MM
    SMART SENSORS, ACTUATORS, AND MEMS II, 2005, 5836 : 380 - 388
  • [10] Bi4Ti3O12 ferroelectric thin film ultraviolet detectors
    Pintilie, L
    Alexe, M
    Pignolet, A
    Hesse, D
    APPLIED PHYSICS LETTERS, 1998, 73 (03) : 342 - 344
12345