Diamond refractive micro-lenses for full-field X-ray imaging and microscopy produced with ion beam lithography

被引:17
|
作者
Medvedskaya, Polina [1 ]
Lyatun, Ivan [1 ]
Shevyrtalov, Sergey [1 ]
Polikarpov, Maxim [2 ]
Snigireva, Irina [3 ]
Yunkin, Vyacheslav [4 ]
Snigirev, Anatoly [1 ]
机构
[1] Immanuel Kant Baltic Fed Univ, Kaliningrad 236004, Russia
[2] DESY, Hamburg Unit, European Mol Biol Lab, D-22603 Hamburg, Germany
[3] ESRF, F-38043 Grenoble, France
[4] RAS, Inst Microelect Technol, Chernogolovka 142432, Russia
来源
OPTICS EXPRESS | 2020年 / 28卷 / 04期
基金
俄罗斯科学基金会;
关键词
DIFFRACTION; TOMOGRAPHY; BERYLLIUM; CRYSTALS; OPTICS; IV;
D O I
10.1364/OE.384647
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrate that ion-beam lithography can be applied to the fabrication of rotationally parabolic refractive diamond X-ray micro-lenses that are of interest to the field of high-resolution X-ray focusing and microscopy. Three single half-lenses with curvature radii of 4.8 mu m were produced and stacked to form a compound refractive lens, which provided diffraction-limited focusing of X-ray radiation at the P14 beamline of PETRA-III (DESY). As shown with SEM, the lenses are free of expressed low- and high-frequency shape modulations with a figure error of < 200 nm and surface roughness of 30 nm. Precise micro-manipulation and stacking of individual lenses are demonstrated, which opens up new opportunities for compact X-ray microscopy with nanometer resolution. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:4773 / 4785
页数:13
相关论文
共 50 条
  • [1] Full-field X-ray diffraction microscopy using polymeric compound refractive lenses
    Hilhorst, J.
    Marschall, F.
    Thi, T. N. Tran
    Last, A.
    Schuelli, T. U.
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2014, 47 : 1882 - 1888
  • [2] Beam-shaping condenser lenses for full-field transmission X-ray microscopy
    Jefimovs, Konstantins
    Vila-Comamala, Joan
    Stampanoni, Marco
    Kaulich, Burkhard
    David, Christian
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2008, 15 : 106 - 108
  • [3] Full-field hard x-ray microscopy with interdigitated silicon lenses
    Simons, Hugh
    Stohr, Frederik
    Michael-Lindhard, Jonas
    Jensen, Flemming
    Hansen, Ole
    Detlefs, Carsten
    Poulsen, Henning Friis
    [J]. OPTICS COMMUNICATIONS, 2016, 359 : 460 - 464
  • [4] Full-field and scanning microtomography based on parabolic refractive x-ray lenses
    Schroer, C. G.
    Kuhlmann, M.
    Guenzler, T. F.
    Benner, B.
    Kurapova, O.
    Patommel, J.
    Lengeler, B.
    Roth, S. V.
    Gehrke, R.
    Snigirev, A.
    Snigireva, I.
    Stribeck, N.
    Almendarez-Camarillo, A.
    Beckmann, F.
    [J]. DEVELOPMENTS IN X-RAY TOMOGRAPHY V, 2006, 6318
  • [5] Magnetic imaging with full-field soft X-ray microscopy
    Fischer, P
    Eimüller, T
    Goll, D
    Stoll, H
    Puzic, A
    Schütz, G
    Denbeaux, G
    [J]. ZEITSCHRIFT FUR METALLKUNDE, 2002, 93 (05): : 377 - 382
  • [6] A Dedicated Illumination For Full-Field X-ray Microscopy With Multilayer Laue Lenses
    Niese, Sven
    Braun, Stefan
    Dietsch, Reiner
    Gluch, Juergen
    Holz, Thomas
    Huber, Norman
    Kubec, Adam
    Zschech, Ehrenfried
    [J]. ICXOM23: INTERNATIONAL CONFERENCE ON X-RAY OPTICS AND MICROANALYSIS, 2016, 1764
  • [7] Full-field X-ray microscopy with crossed partial multilayer Laue lenses
    Niese, Sven
    Krueger, Peter
    Kubec, Adam
    Braun, Stefan
    Patommel, Jens
    Schroer, Christian G.
    Leson, Andreas
    Zschech, Ehrenfried
    [J]. OPTICS EXPRESS, 2014, 22 (17): : 20008 - 20013
  • [8] Full-field transmission x-ray microscopy for bio-imaging
    Andrews, J. C.
    Brennan, S.
    Liu, Y.
    Pianetta, P.
    Almeida, E. A. C.
    van der Meulen, M. C. H.
    Wu, Z.
    Mester, Z.
    Ouerdane, L.
    Gelb, J.
    Feser, M.
    Rudati, J.
    Tkachuk, A.
    Yun, W.
    [J]. 9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2009, 186
  • [9] Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials
    Andrews, Joy C.
    Meirer, Florian
    Liu, Yijin
    Mester, Zoltan
    Pianetta, Piero
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2011, 74 (07) : 671 - 681
  • [10] Beryllium parabolic refractive X-ray lenses for full field imaging and scanning microscopy with hard X-rays
    Lengeler, B
    Schroer, CG
    Kuhlmann, M
    Benner, B
    Günzler, TF
    Kurapova, O
    Rau, C
    Weitkamp, T
    Simionovici, A
    Snigirev, A
    Snigireva, I
    [J]. JOURNAL DE PHYSIQUE IV, 2003, 104 : 221 - 221