Fault detection and location using IDD waveform analysis

被引：24
|
作者：
Muhammad, K [1 ]
Roy, K [1 ]
机构：
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2001年 / 18卷 / 01期
关键词：
D O I：
10.1109/54.902821
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
I-DD waveform analysis can detect defects that I,,, testing cannot. An investigation of I-DD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits.
引用
收藏
页码：42 / 49
页数：8
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