Fault detection and location using IDD waveform analysis

被引：24

作者：

Muhammad, K ^{[1
]}

Roy, K ^{[1
]}

机构：

[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2001年 / 18卷 / 01期

关键词：

D O I：

10.1109/54.902821

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

I-DD waveform analysis can detect defects that I,,, testing cannot. An investigation of I-DD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits.

引用

页码：42 / 49

页数：8

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