共 50 条
- [1] Device properties in 90nm and beyond and implications on circuit design [J]. 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 2003, : 43 - 46
- [2] Yield enhancement challenges for 90nm and beyond [J]. ASCMC 2003: IEEE/SEMI (R) ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP, PROCEEDINGS, 2003, : 262 - 265
- [3] Challenges for ultra-shallow junction formation technologies beyond the 90nm node [J]. 11TH IEEE INTERNATIONAL CONFERENCE ON ADVANCED THERMAL PROCESSING OF SEMICONDUCTORS, 2003, : 17 - 33
- [4] Post implant strip optimization for 90nm and beyond technologies [J]. 2006 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP, 2006, : 289 - +
- [5] Meeting the challenges of elemental analysis in 90nm & beyond technologies - Case studies of scanning Auger nanoprobe [J]. 2006 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 2006, : 768 - +
- [6] Cosmic-ray immune latch circuit for 90nm technology and beyond [J]. 2004 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE, DIGEST OF TECHNICAL PAPERS, 2004, 47 : 492 - 493
- [7] Methodology and design challenges for low power implementation at sub 90nm [J]. PROCEEDINGS IEEE SOUTHEASTCON 2007, VOLS 1 AND 2, 2007, : 787 - 794
- [10] Product reliability in 90nm CMOS and beyond [J]. 2005 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP, FINAL REPORT, 2005, : 163 - 167