Scanning low-energy electron microscopy

被引:103
|
作者
Müllerová, I [1 ]
Frank, L [1 ]
机构
[1] Acad Sci Czech Republ, Inst Sci Instruments, CZ-61264 Brno, Czech Republic
关键词
D O I
10.1016/S1076-5670(03)80066-6
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:309 / 443
页数:135
相关论文
共 50 条
  • [31] Low-energy electron microscopy: Imaging surface dynamics
    Phaneuf, RJ
    Schmid, AK
    [J]. PHYSICS TODAY, 2003, 56 (03) : 50 - 55
  • [32] LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACE PROCESSES
    BAUER, E
    [J]. APPLIED SURFACE SCIENCE, 1992, 60-1 : 350 - 358
  • [33] Sensitivity to crystal stacking in low-energy electron microscopy
    Jugovac, Matteo
    Mentes, Tevfik Onur
    Genuzio, Francesca
    Lachnitt, Jan
    Feyer, Vitaliy
    Flege, Jan Ingo
    Locatelli, Andrea
    [J]. APPLIED SURFACE SCIENCE, 2021, 566
  • [34] Low-energy electron microscopy of surface phase transitions
    Hannon, JB
    Tromp, RM
    [J]. ANNUAL REVIEW OF MATERIALS RESEARCH, 2003, 33 : 263 - 288
  • [35] LOW-ENERGY ELECTRON-MICROSCOPY OF SEMICONDUCTOR SURFACES
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1007 - 1013
  • [36] Strain Mapping by Scanning Low Energy Electron Microscopy
    Mikmekova, Sarka
    Man, Ondrej
    Pantelejev, Libor
    Hovorka, Milos
    Muellerova, Ilona
    Frank, Ludek
    Kouril, Miloslav
    [J]. MATERIALS STRUCTURE & MICROMECHANICS OF FRACTURE, 2011, 465 : 338 - +
  • [37] Very low energy scanning electron microscopy in nanotechnology
    Muellerova, Ilona
    Hovorka, Milos
    Mika, Filip
    Mikmekova, Eliska
    Mikmekova, Sarka
    Pokorna, Zuzana
    Frank, Ludek
    [J]. INTERNATIONAL JOURNAL OF NANOTECHNOLOGY, 2012, 9 (8-9) : 695 - 716
  • [38] Towards quantification of doping in gallium arsenide nanostructures by low-energy scanning electron microscopy and conductive atomic force microscopy
    Guo, Ran
    Walther, Thomas
    [J]. JOURNAL OF MICROSCOPY, 2024, 293 (03) : 160 - 168
  • [39] Material surface characterization using low-energy electron microscopy and photoemission electron microscopy
    Mohanty, S. R.
    Paul, S.
    Menon, K. S. R.
    [J]. INDIAN JOURNAL OF PHYSICS, 2023, 97 (08) : 2395 - 2404
  • [40] Material surface characterization using low-energy electron microscopy and photoemission electron microscopy
    S. R. Mohanty
    S. Paul
    K. S. R. Menon
    [J]. Indian Journal of Physics, 2023, 97 : 2395 - 2404