Material surface characterization using low-energy electron microscopy and photoemission electron microscopy

被引：1
|
作者：
Mohanty, S. R. [1 ]
Paul, S. [1 ]
Menon, K. S. R. [1 ]
机构：
[1] A CI Homi Bhabha Natl Inst, Saha Inst Nucl Phys, Surface Phys & Mat Sci Div, 1-AF Bidhannagar, Kolkata 700064, India
来源：
INDIAN JOURNAL OF PHYSICS | 2023年 / 97卷 / 08期
关键词：
Low-energy electron microscopy (LEEM); Photoemission electron microscopy (PEEM); Low-energy electron diffraction (LEED); LEEM;
D O I：
10.1007/s12648-022-02577-9
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We describe a state-of-the-art surface imaging and material characterization facility recently established for advanced structural, morphological, and electronic structure characterization of material surfaces in real time with nanometre spatial resolutions. Here, we discuss the basic principles of operation as well as the technical details of the low-energy electron microscopy cum photoemission electron microscopy (LEEM-PEEM) facility, which is similar to the transmission electron microscopes. We also present some of our experimental results on various material systems along with the demonstration of the high spatial resolution imaging capabilities as well as the availability of various contrast mechanisms that can be well utilized for nanomaterials research.
引用
收藏
页码：2395 / 2404
页数：10
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