Oxide trapped charge and time to breakdown of pulsed current measurements in the Fowler-Nordheim regime

被引：0
|
作者：
Martin, A
Duane, R
OSullivan, P
Mathewson, A
机构：
来源：
1996 INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT | 1996年
关键词：
D O I：
10.1109/IRWS.1996.583406
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：167 / 167
页数：1
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