Existence of ferroelectric resistive switching memory in MoS2/PVDF heterojunction devices

被引:0
|
作者
Liu, Wei-song [1 ]
Yang, Hui [1 ]
Li, Lan [1 ]
机构
[1] Tianjin Univ Technol, Sch Mat Sci & Engn, Inst Mat Phys,Tianjin Key Lab Optoelect Mat & Dev, Minist Educ,Key Lab Display Mat & Photoelect Devi, Tianjin 300384, Peoples R China
基金
中国国家自然科学基金;
关键词
hysteresis; resistive switching; polarization field; PVDF; MoS2; MECHANISMS;
D O I
10.1088/1361-6463/ac100d
中图分类号
O59 [应用物理学];
学科分类号
摘要
The heterostructure device based on polyvinylidene fluoride (PVDF)/MoS2 films was succesfully prepared and showed a good hysteresis feature with a unique resistive switching perpromance, where the logarithmic I-V curve looks like a butterfly. The on-off ratio for the resistive switching in the device based on PVDF/MoS2 films reaches 2.5 x 10(2) and the resistive switching happens at -0.9 V and -4.9 V for a half loop. The influence of the introduction of MoS2 and ferroelectric PVDF film was also studied and compared to a device based on a single film. The underlying physical mechanism for the unique resistive transition was attributed to the polarization field from the ferroelectric polymer PVDF and the S vacancies in MoS2.
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页数:6
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