Selection of contact materials to p-type halide perovskite by electronegativity matching

被引:4
|
作者
Long, Ruiying [1 ,2 ,3 ]
Li, Binghan [1 ,2 ,3 ]
Mi, Qixi [1 ]
机构
[1] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
关键词
ELECTRONIC-PROPERTIES; INTERFACE; EFFICIENCY; STATES;
D O I
10.1063/5.0008406
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The performance of perovskite optoelectronic devices depends critically on the contact between the active layer and charge transport materials. To reveal the mechanism of barrier formation on perovskite surfaces, we studied Schottky junctions between various metals and a p-type perovskite CsSnBr3. By constructing slab models of the junction interface and aligning atomic core levels, the contacts between Au/CsSnBr3 and graphite/CsSnBr3 were found to be ohmic, but various other metals produced Schottky junctions with CsSnBr3. These calculation results, supported by x-ray photoelectron spectroscopy measurements, suggest that the barrier height of a metal/CsSnBr3 junction is a linear function of the metal's electronegativity, rather than its work function. By introducing the concept of effective electronegativity for compounds, this trend was extended to a general rule that a suitable transport material should have an effective electronegativity to match that of the perovskite. (c) 2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
引用
收藏
页数:5
相关论文
共 50 条
  • [41] Developing a Robust Recombination Contact to Realize Monolithic Perovskite Tandems With Industrially Common p-Type Silicon Solar Cells
    Hoye, Robert L. Z.
    Bush, Kevin A.
    Oviedo, Felipe
    Sofia, Sarah E.
    Thway, Maung
    Li, Xinhang
    Liu, Zhe
    Jean, Joel
    Mailoa, Jonathan P.
    Osherov, Anna
    Lin, Fen
    Palmstrom, Axel F.
    Bulovic, Vladimir
    McGehee, Michael D.
    Peters, Ian Marius
    Buonassisi, Tonio
    IEEE JOURNAL OF PHOTOVOLTAICS, 2018, 8 (04): : 1023 - 1028
  • [42] Design Principles of p-Type Transparent Conductive Materials
    Cao, Ruyue
    Deng, Hui-Xiong
    Luo, Jun-Wei
    ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (28) : 24837 - 24849
  • [43] BONDING MATERIALS FOR MAKING CONTACTS TO P-TYPE SILICON
    MASON, DR
    SARACE, JC
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (10) : 594 - 598
  • [44] OXYCHALCOGENIDES AS NEW EFFICIENT p-TYPE THERMOELECTRIC MATERIALS
    Barreteau, Celine
    Pan, Lin
    Pei, Yan-Ling
    Zhao, Li-Dong
    Berardan, David
    Dragoe, Nita
    FUNCTIONAL MATERIALS LETTERS, 2013, 6 (05)
  • [45] PREPARATION OF P-TYPE GAAS-LAYERS FOR OHMIC CONTACT
    MACHAC, P
    NAHLIK, J
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1995, 6 (02) : 115 - 117
  • [46] On the specific contact resistance of metal contacts to p-type GaN
    Lewis, L.
    Maaskant, P. P.
    Corbett, B.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 21 (12) : 1738 - 1742
  • [47] Crystal orientation dependence of p-type contact resistance of GaN
    Mochida, N
    Honda, T
    Shirasawa, T
    Inoue, A
    Sakaguchi, T
    Koyama, F
    Iga, K
    JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 716 - 719
  • [48] Carrier transport mechanism of Ohmic contact to p-type diamond
    Yokoba, M
    Koide, Y
    Otsuki, A
    Ako, F
    Oku, T
    Murakami, M
    JOURNAL OF APPLIED PHYSICS, 1997, 81 (10) : 6815 - 6821
  • [50] Schottky barrier heights of contact metals to p-type ZnSe
    Koide, Y
    Kawakami, T
    Murakami, M
    Teraguchi, N
    Tomomura, Y
    Suzuki, A
    JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (06) : 772 - 775