Geometrical verification of dynamic intensity modulated radiotherapy using an amorphous silicon flat panel imager

被引：0
|
作者：
Sonke, JJ [1 ]
Ploeger, LS [1 ]
Brand, B [1 ]
Smitsmans, MHP [1 ]
van Herk, M [1 ]
机构：
[1] Antoni Van Leeuwenhoek Hosp, Netherlands Canc Inst, Amsterdam, Netherlands
来源：
MEDICAL PHYSICS | 2003年 / 30卷 / 06期
关键词：
D O I：
暂无
中图分类号：
R8 [特种医学]; R445 [影像诊断学];
学科分类号：
1002 ; 100207 ; 1009 ;
摘要：
引用
收藏
页码：1352 / 1352
页数：1
相关论文
共 50 条
  • [1] Leaf trajectory verification during dynamic intensity modulated radiotherapy using an amorphous silicon flat panel imager
    Sonke, JJ
    Ploeger, LS
    Brand, B
    Smitsmans, MHP
    van Herk, M
    [J]. MEDICAL PHYSICS, 2004, 31 (02) : 389 - 395
  • [2] ON RADIOTHERAPY DOSE VERIFICATION WITH A FLAT-PANEL IMAGER
    McDermott, L.
    [J]. RADIOTHERAPY AND ONCOLOGY, 2009, 92 : S49 - S49
  • [3] Dosimetric verification of IMRT fields using an amorphous silicon flat panel imager and Monte Carlo simulation
    Kim, J
    Siebers, J
    Keall, P
    [J]. MEDICAL PHYSICS, 2002, 29 (06) : 1197 - 1197
  • [4] A method for geometrical verification of dynamic intensity modulated radiotherapy using a scanning electronic portal imaging device
    Ploeger, LS
    Smitsmans, MHP
    Gilhuijs, KGA
    van Herk, M
    [J]. MEDICAL PHYSICS, 2002, 29 (06) : 1071 - 1079
  • [5] Characterization of amorphous silicon flat panel imager for dose measurements
    Szabo, J.
    Khan, R.
    Ostapiak, O.
    [J]. MEDICAL PHYSICS, 2007, 34 (06) : 2423 - 2423
  • [6] Quantitative verification of IMRT intensity maps using an amorphous silicon electronic portal imager
    Yao, B
    Peng, W
    Santanam, L
    Van den Heuvel, F
    Burmeister, J
    [J]. MEDICAL PHYSICS, 2005, 32 (06) : 1987 - 1987
  • [7] Dosimetry of X-ray fields with an amorphous silicon flat panel imager
    Wendling, M
    McDermott, LN
    Sonke, JJ
    Louwe, RJW
    Van Herk, MB
    Mijnheer, BJ
    [J]. RADIOTHERAPY AND ONCOLOGY, 2003, 68 : S26 - S27
  • [8] Potential and limitations of the automatic detection of fiducial markers using an amorphous silicon flat-panel imager
    Buck, D
    Alber, M
    Nüsslin, F
    [J]. PHYSICS IN MEDICINE AND BIOLOGY, 2003, 48 (06): : 763 - 774
  • [9] Dosimetric properties of an amorphous silicon EPID for verification of modulated electron radiotherapy
    Chatelain, Cecile
    Vetterli, Daniel
    Henzen, Dominik
    Favre, Pascal
    Morf, Daniel
    Scheib, Stefan
    Fix, Michael K.
    Manser, Peter
    [J]. MEDICAL PHYSICS, 2013, 40 (06)
  • [10] Megavoltage imaging with a large-area, flat-panel, amorphous silicon imager
    Antonuk, LE
    Yorkston, J
    Huang, WD
    Sandler, H
    Siewerdsen, JH
    ElMohri, Y
    [J]. INTERNATIONAL JOURNAL OF RADIATION ONCOLOGY BIOLOGY PHYSICS, 1996, 36 (03): : 661 - 672
12345