Dosimetry of X-ray fields with an amorphous silicon flat panel imager

被引：0
|
作者：
Wendling, M [1 ]
McDermott, LN [1 ]
Sonke, JJ [1 ]
Louwe, RJW [1 ]
Van Herk, MB [1 ]
Mijnheer, BJ [1 ]
机构：
[1] Netherlands Canc Inst, Dept Radiotherapy, Amsterdam, Netherlands
来源：
RADIOTHERAPY AND ONCOLOGY | 2003年 / 68卷
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D O I：
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中图分类号：
R73 [肿瘤学];
学科分类号：
100214 ;
摘要：
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页码：S26 / S27
页数：2
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