Defect Analysis on Optical Waveguide Arrays by Synchrotron Radiation Microtomography

被引：6

作者：

Manescu, A. ^{[1
]}

Di Gregorio, G. M. ^{[2
]}

Girardin, E. ^{[3
]}

Calbucci, V. ^{[3
]}

Angeloni, G. ^{[2
]}

Carta, P. ^{[2
]}

Giuliani, A. ^{[1
]}

Albertini, G. ^{[3
]}

机构：

[1] Univ Politecn Marche, Dipartimento DISCO, I-60131 Ancona, Italy

[2] SOMACIS SpA, R&D Dept, I-60022 Castelfidardo, Italy

[3] Univ Politecn Marche, Dipartimento FIMET, I-60131 Ancona, Italy

来源：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2011年 / 11卷 / 04期

关键词：

Computed microtomography (micro-CT); defect analysis; optical waveguides (OWGs); printed circuit boards (PCBs); synchrotron radiation;

D O I：

10.1109/TDMR.2011.2168562

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In recent years, great attention has been devoted to the study and realization of polymeric optical waveguides embedded in printed circuit boards due to the increasing need of transferring large amounts of data at high speed within computer and telecommunication devices. Nonuniform microstructural defects that can be induced during the manufacturing process can dramatically influence the waveguide performance. The synchrotron radiation computed microtomography technique was used to obtain 3-D microstructural information, specifically to observe small defects, such as porosities, in a nondestructive way. Porosity level and pore size range were evaluated.

引用

页码：548 / 550

页数：3

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