Analysis of the accuracy of methods for the direct measurement of emissivity

被引:58
|
作者
Perez-Saez, Raul B. [1 ,2 ]
del Campo, Leire [1 ]
Tello, Manuel J. [1 ,2 ]
机构
[1] Univ Basque Country, Fac Ciencias & Tecnol, Dept Fis Mat Condensada, Leioa 48940, Bizkaia, Spain
[2] Univ Basque Country, Inst Sintesis & Estudio Mat, E-48080 Bilbao, Spain
关键词
direct measurement; emissivity; radiometry; systematic error;
D O I
10.1007/s10765-008-0402-4
中图分类号
O414.1 [热力学];
学科分类号
摘要
Emissivity measurements are of great interest for both theoretical studies and technological applications. Emissivity is a property that specifies how much radiation a real body emits as compared to a blackbody. The emissivity determination of a sample should be an easy task: a simple comparison between the sample and blackbody radiation at the same temperature. Unfortunately, when measuring the emissivity, some practical problems arise due to the differences between the true emitted radiation and the detected quantity. To clarify this point, an analysis of different direct methods for emissivity measurement is presented. Furthermore, a method that includes multiple reflections is developed. The systematic errors associated with each method are computed theoretically as a function of wavelength, sample temperature, and emissivity, and the surrounding enclosure temperature and emissivity. In general, the error is very high for small sample enclosures, but it strongly decreases when the enclosure area increases. Although at short wavelengths all the analyzed methods produce similar errors, noticeable differences appear under other conditions, and methods considering more radiation terms do not always produce lower errors.
引用
收藏
页码:1141 / 1155
页数:15
相关论文
共 50 条
  • [31] SPECTRAL EMISSIVITY MEASUREMENT
    DOMINGUEZ, KS
    WYNNYCKYJ, JR
    INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 1989, 32 (08) : 1575 - 1580
  • [32] METHODS FOR DIRECT MEASUREMENT OF PLASMA POTENTIAL
    ANDERSEN, SA
    CHRISTOFFERSEN, GB
    MICHELSEN, P
    JENSEN, VO
    PLASMA PHYSICS, 1972, 14 (02): : 202 - +
  • [33] The measurement of polarisation by the direct and commutator methods
    Ferguson, AL
    Chen, GM
    JOURNAL OF PHYSICAL CHEMISTRY, 1932, 36 (04): : 1166 - 1177
  • [34] Study on GPS measurement accuracy and improving methods
    Yu, HH
    He, Y
    Ge, XF
    ACTUAL TASKS ON AGRICULTURAL ENGINEERING, 2005, 33 : 391 - 399
  • [35] Accurate methods for single-band apparent emissivity measurement of opaque materials
    Riou, Olivier
    Guiheneuf, Vincent
    Delaleux, Fabien
    Logerais, Pierre-Olivier
    Durastanti, Jean-Felix
    MEASUREMENT, 2016, 89 : 239 - 251
  • [36] Uncertainty Analysis for Emissivity Measurement at Elevated Temperatures with an Infrared Camera
    Hoeser, Dragana
    Wallimann, R.
    von Rohr, Ph. Rudolf
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2016, 37 (02) : 1 - 17
  • [37] EXPERIMENTAL MEASUREMENT, ANALYSIS AND MODELLING OF DEPENDENCY EMISSIVITY IN FUNCTION OF TEMPERATURE
    Ahmed, N. Baba
    Benmoussat, A.
    Benouaz, T.
    JOURNAL OF FUNDAMENTAL AND APPLIED SCIENCES, 2010, 2 (01) : 12 - 22
  • [38] Uncertainty Analysis for Emissivity Measurement at Elevated Temperatures with an Infrared Camera
    Dragana Höser
    R. Wallimann
    Ph. Rudolf von Rohr
    International Journal of Thermophysics, 2016, 37
  • [39] Sensitivity analysis of high temperature spectral emissivity measurement method
    Vesely, Z.
    Honnerova, P.
    Martan, J.
    Honner, M.
    INFRARED PHYSICS & TECHNOLOGY, 2015, 71 : 217 - 222
  • [40] Analysis of RSRP Measurement Accuracy
    Park, Chester Sungchung
    Park, Sungkyung
    IEEE COMMUNICATIONS LETTERS, 2016, 20 (03) : 430 - 433