Circuit design compliance checking in VLSI circuits

被引：0
|
作者：
Lam, KN [1 ]
Rusu, S [1 ]
机构：
[1] L LOG DESIGN GRP,SUNNYVALE,CA 94089
来源：
NINTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：167 / 170
页数：4
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