A compact analytical current conduction model for a depletion-mode n-type nanowire field-effect transistor with a bottom-gate structure
被引:9
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作者:
Yu, Yun Seop
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Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Hankyong Natl Univ, Grad Sch Bioenvironnm & Informat Technol, Anseong 456749, Gyeonggi, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Yu, Yun Seop
[1
,2
]
Lee, Se Han
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机构:
Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South Korea
Korea Univ, Res Ctr Time Domain Nanofunct Devices, Seoul 136075, South Korea
Korea Univ, Dept Elect & Comp Engn, Seoul 136075, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Lee, Se Han
[3
,4
,5
]
Oh, Jung Hyun
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Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Oh, Jung Hyun
[3
]
Kim, Han Jung
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Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Hankyong Natl Univ, Grad Sch Bioenvironnm & Informat Technol, Anseong 456749, Gyeonggi, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Kim, Han Jung
[1
,2
]
Hwang, Sung Woo
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机构:
Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South Korea
Korea Univ, Res Ctr Time Domain Nanofunct Devices, Seoul 136075, South Korea
Korea Univ, Dept Elect & Comp Engn, Seoul 136075, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Hwang, Sung Woo
[3
,4
,5
]
Ahn, Doyel
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Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South KoreaHankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
Ahn, Doyel
[3
]
机构:
[1] Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
[2] Hankyong Natl Univ, Grad Sch Bioenvironnm & Informat Technol, Anseong 456749, Gyeonggi, South Korea
[3] Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South Korea
[4] Korea Univ, Res Ctr Time Domain Nanofunct Devices, Seoul 136075, South Korea
[5] Korea Univ, Dept Elect & Comp Engn, Seoul 136075, South Korea
A compact analytical current conduction model for depletion-mode n-type nanowire field-effect transistors ( NWFETs) with a bottom-gate structure is introduced. Our model includes the current conductions of bulk charges through the center neutral region as well as of accumulation charges through the surface accumulation region, and thus it includes all current conduction mechanisms of the NWFET operating under various bias conditions. Our model also includes surface depletion effects and series resistance effects. The NWFET model is implemented to the circuit simulator ADS, and the intrinsic part of the NWFET is developed by utilizing the symbolically defined device which is an equation-based nonlinear model. The results simulated from the newly developed NWFET model reproduce two types of the reported experimental results within a 10% error.
机构:
Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Royal Saudi Naval Forces, King Abdul Aziz Rd, Riyadh 12622, Saudi ArabiaUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Albariqi, Mohammed
Gruntz, Guillaume
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Univ Bordeaux, UMR CNRS 5255, ISM, F-33405 Talence, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Gruntz, Guillaume
Al-Hathal, Thamer
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Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Royal Saudi Naval Forces, King Abdul Aziz Rd, Riyadh 12622, Saudi ArabiaUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Al-Hathal, Thamer
Peinado, Alba
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Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Peinado, Alba
Garcia-Caurel, Enric
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Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Garcia-Caurel, Enric
Nicolas, Yohann
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Univ Bordeaux, UMR CNRS 5255, ISM, F-33405 Talence, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Nicolas, Yohann
Toupance, Thierry
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Univ Bordeaux, UMR CNRS 5255, ISM, F-33405 Talence, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Toupance, Thierry
Bonnassieux, Yvan
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Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
Bonnassieux, Yvan
Horowitz, Gilles
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Univ Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, FranceUniv Paris Saclay, Ecole Polytech, UMR CNRS 7647, LPICM, F-91128 Palaiseau, France
机构:
Univ Hassan II Ain Chok, Fac Sci, Lab Phys Mat & Microelect, Casablanca, MoroccoUniv Hassan II Ain Chok, Fac Sci, Lab Phys Mat & Microelect, Casablanca, Morocco
Touhami, A
Bouhdada, A
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Univ Hassan II Ain Chok, Fac Sci, Lab Phys Mat & Microelect, Casablanca, MoroccoUniv Hassan II Ain Chok, Fac Sci, Lab Phys Mat & Microelect, Casablanca, Morocco
机构:
Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
Huo, Jiali
Li, Lingqi
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Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
Li, Lingqi
Zheng, Haofei
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Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
Zheng, Haofei
Gao, Jing
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Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
Gao, Jing
Tun, Thaw Tint Te
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Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
Tun, Thaw Tint Te
Xiang, Heng
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Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore,117583, Singapore
机构:
Elect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South Korea
Jang, MY
Kim, Y
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机构:Elect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South Korea
Kim, Y
Shin, JH
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机构:Elect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South Korea
Shin, JH
Lee, S
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机构:Elect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South Korea
Lee, S
Park, K
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机构:Elect & Telecommun Res Inst, Semicond & Basic Res Lab, Taejon 305350, South Korea