A compact analytical current conduction model for a depletion-mode n-type nanowire field-effect transistor with a bottom-gate structure

被引:9
|
作者
Yu, Yun Seop [1 ,2 ]
Lee, Se Han [3 ,4 ,5 ]
Oh, Jung Hyun [3 ]
Kim, Han Jung [1 ,2 ]
Hwang, Sung Woo [3 ,4 ,5 ]
Ahn, Doyel [3 ]
机构
[1] Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, Gyeonggi, South Korea
[2] Hankyong Natl Univ, Grad Sch Bioenvironnm & Informat Technol, Anseong 456749, Gyeonggi, South Korea
[3] Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South Korea
[4] Korea Univ, Res Ctr Time Domain Nanofunct Devices, Seoul 136075, South Korea
[5] Korea Univ, Dept Elect & Comp Engn, Seoul 136075, South Korea
关键词
D O I
10.1088/0268-1242/23/3/035025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A compact analytical current conduction model for depletion-mode n-type nanowire field-effect transistors ( NWFETs) with a bottom-gate structure is introduced. Our model includes the current conductions of bulk charges through the center neutral region as well as of accumulation charges through the surface accumulation region, and thus it includes all current conduction mechanisms of the NWFET operating under various bias conditions. Our model also includes surface depletion effects and series resistance effects. The NWFET model is implemented to the circuit simulator ADS, and the intrinsic part of the NWFET is developed by utilizing the symbolically defined device which is an equation-based nonlinear model. The results simulated from the newly developed NWFET model reproduce two types of the reported experimental results within a 10% error.
引用
收藏
页数:6
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