XRMA and ToF-SIMS Analysis of Normal and Hypomineralized Enamel

被引:9
|
作者
Melin, Lisa [1 ]
Lundgren, Jesper [2 ]
Malmberg, Per [3 ]
Noren, Jorgen G. [1 ]
Taube, Fabian [4 ]
Cornell, David H. [5 ]
机构
[1] Univ Gothenburg, Sahlgrenska Acad, Inst Odontol, Dept Pediat Dent, SE-40530 Gothenburg, Sweden
[2] Univ Gothenburg, Dept Psychol, SE-40530 Gothenburg, Sweden
[3] Chalmers Univ Technol, Dept Chem & Biol Engn, S-41296 Gothenburg, Sweden
[4] Sahlgrens Univ Hosp, Dept Occupat & Environm Med, SE-40530 Gothenburg, Sweden
[5] Univ Gothenburg, Dept Earth Sci, SE-40530 Gothenburg, Sweden
关键词
enamel; MIH; SEM; ToF-SIMS; XRMA; MOLAR-INCISOR-HYPOMINERALISATION; X-RAY-MICROANALYSIS; ION MASS-SPECTROMETRY; CONE-ROD DYSTROPHY; DENTAL ENAMEL; MECHANICAL-PROPERTIES; DEMARCATED OPACITIES; CHEMICAL-COMPOSITION; TOOTH ENAMEL; MAGNESIUM;
D O I
10.1017/S1431927615000033
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Molar incisor hypomineralization (MIH) is a developmental disturbance of the enamel. This study presents analyses of hypomineralized and normal enamel in first molar teeth diagnosed with MIH, utilizing time-of-flight secondary ion mass spectrometry area analyses and X-ray microanalysis of area and spot profiles in uncoated samples between gold lines which provide electrical conductivity. Statistical analysis of mean values allows discrimination of normal from MIH enamel, which has higher Mg and lower Na and P. Inductive analysis using complete data sets for profiles from the enamel surface to the enamel-dentin junction found that Mg, Cl and position in the profile provide useful discrimination criteria. Element profiles provide a visual complement to the inductive analysis and several elements also provide insight into the development of both normal and MIH enamel. The higher Mg content and different Cl profiles of hypomineralized enamel compared with normal enamel are probably related to a relatively short period during the development of ameloblasts between birth and the 1st year of life.
引用
收藏
页码:407 / 421
页数:15
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