Towards an automated test generation with delayed transitions for timed systems

被引：0
|
作者：
Vieira, Elisangela Rodrigues [1 ,2 ]
Cavalli, Ana [1 ,2 ]
机构：
[1] CNRS, Lab SAMOVAR, 9 Rue Charles Fourier, F-91011 Evry, France
[2] GET, INT, 9 Rue Charles Fourier, F-91011 Evry, France
来源：
13TH IEEE INTERNATIONAL CONFERENCE ON EMBEDDED AND REAL-TIME COMPUTING SYSTEMS AND APPLICATIONS, PROCEEDINGS | 2007年
关键词：
D O I：
10.1109/RTCSA.2007.71
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper we analyze the influence of the urgency in the timed transitions, and as consequence, in the test suite generation. As result, we formalize rules to generate sequences where the messages exchanged may be instantaneous or delayed. In addition, the generated scenarios are able to detect timing faults. For test generation, we use a prototype tool called HJ2IF It is based on a test purpose algorithm, called Hit-or-Jump and it is applied for systems specified using Intermediate Format language (IF).
引用
收藏
页码：226 / +
页数：2
相关论文
共 50 条
  • [41] Timed test cases generation based on state characterization technique
    En-Nouaary, A
    Dssouli, R
    Khendek, F
    Elqortobi, A
    19TH IEEE REAL-TIME SYSTEMS SYMPOSIUM, PROCEEDINGS, 1998, : 220 - 229
  • [42] Test Generation from Timed Pushdown Automata with Inputs and Outputs
    M'Hemdi, Hana
    Julliand, Jacques
    Masson, Pierre-Alain
    Robbana, Riadh
    2015 IEEE EIGHTH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW), 2015,
  • [43] Automatic generation of path conditions for concurrent timed systems
    Bensalem, Saddek
    Peled, Doron
    Qu, Hongyang
    Tripakis, Stavros
    THEORETICAL COMPUTER SCIENCE, 2008, 404 (03) : 275 - 292
  • [44] Diagnosability test for timed discrete-event systems
    Pan, J.
    Hashtrudi-Zad, S.
    ICTAI-2006: EIGHTEENTH INTERNATIONAL CONFERENCE ON TOOLS WITH ARTIFICIAL INTELLIGENCE, PROCEEDINGS, 2006, : 63 - +
  • [45] Automated test generation and verified software
    Rushby, John
    VERIFIED SOFTWARE: THEORIES, TOOLS, EXPERIMENTS, 2008, 4171 : 161 - 172
  • [46] Application for UDS Automated Test Generation
    Lupei, Anca
    Stanciu, Loredana
    2016 IEEE 11TH INTERNATIONAL SYMPOSIUM ON APPLIED COMPUTATIONAL INTELLIGENCE AND INFORMATICS (SACI), 2016, : 85 - 88
  • [47] Teaching automated test case generation
    Chen, TY
    Kuo, FC
    Zhou, ZQ
    QSIC 2005: FIFTH INTERNATIONAL CONFERENCE ON QUALITY SOFTWARE, PROCEEDINGS, 2005, : 327 - 332
  • [48] Practitioners' Expectations on Automated Test Generation
    Yu, Xiao
    Liu, Lei
    Hu, Xing
    Keung, Jacky
    Xia, Xin
    Lo, David
    PROCEEDINGS OF THE 33RD ACM SIGSOFT INTERNATIONAL SYMPOSIUM ON SOFTWARE TESTING AND ANALYSIS, ISSTA 2024, 2024, : 1618 - 1630
  • [49] Automated test set generation for statecharts
    Bogdanov, K
    Holcombe, M
    Singh, H
    APPLIED FORMAL METHODS - FM-TRENDS 98, 1999, 1641 : 107 - 121
  • [50] AUTOMATED SOFTWARE TEST DATA GENERATION
    KOREL, B
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1990, 16 (08) : 870 - 879
12345