Towards an automated test generation with delayed transitions for timed systems

被引：0
|
作者：
Vieira, Elisangela Rodrigues [1 ,2 ]
Cavalli, Ana [1 ,2 ]
机构：
[1] CNRS, Lab SAMOVAR, 9 Rue Charles Fourier, F-91011 Evry, France
[2] GET, INT, 9 Rue Charles Fourier, F-91011 Evry, France
来源：
13TH IEEE INTERNATIONAL CONFERENCE ON EMBEDDED AND REAL-TIME COMPUTING SYSTEMS AND APPLICATIONS, PROCEEDINGS | 2007年
关键词：
D O I：
10.1109/RTCSA.2007.71
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper we analyze the influence of the urgency in the timed transitions, and as consequence, in the test suite generation. As result, we formalize rules to generate sequences where the messages exchanged may be instantaneous or delayed. In addition, the generated scenarios are able to detect timing faults. For test generation, we use a prototype tool called HJ2IF It is based on a test purpose algorithm, called Hit-or-Jump and it is applied for systems specified using Intermediate Format language (IF).
引用
收藏
页码：226 / +
页数：2
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