High-accuracy laser metrology enhances the VLTI

被引：0
|
作者：
Lévéque, S [1 ]
Salvadé, Y
Dändliker, R
Scherler, O
机构：
[1] European So Observ, Munich, Germany
[2] Univ Neuchatel, Inst Microtechnol, Appl Opt Grp, CH-2000 Neuchatel, Switzerland
来源：
LASER FOCUS WORLD | 2002年 / 38卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Ambitious interferometry programs at the Very Large Telescope Interferometer require implementation of a super-heterodyne laser metrology system to monitor optical path variations.
引用
收藏
页码：101 / +
页数：3
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