High-accuracy laser metrology enhances the VLTI

被引:0
|
作者
Lévéque, S [1 ]
Salvadé, Y
Dändliker, R
Scherler, O
机构
[1] European So Observ, Munich, Germany
[2] Univ Neuchatel, Inst Microtechnol, Appl Opt Grp, CH-2000 Neuchatel, Switzerland
来源
LASER FOCUS WORLD | 2002年 / 38卷 / 04期
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ambitious interferometry programs at the Very Large Telescope Interferometer require implementation of a super-heterodyne laser metrology system to monitor optical path variations.
引用
收藏
页码:101 / +
页数:3
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