Silicon Nanowires Integrated in a Fully Depleted CMOS Process for Charge Based Biosensing

被引:0
|
作者
Jayakumar, G. [1 ]
Asadollahi, A. [1 ]
Hellstrom, P-E [1 ]
Garidis, K. [1 ]
Ostling, M. [1 ]
机构
[1] KTH Royal Inst Technol, Sch ICT, Kista, Sweden
关键词
nanowire; biosensing; SOI; CMOS; STL;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe a silicon nanowire (SiNW) biosensor fabricated in a fully depleted SOI CMOS process. The sensor array consists of 32 by 32 pixel matrix (1024 pixels or test sites) and 8 input-output (I/O) pins. In each pixel single crystalline SiNW with 60 by 20 nm cross-section area is defined using sidewall transfer lithography (STL) in the SOI layer. The key advantage of the design is that 1024 individual SiNWs can be read-out sequentially and used for real-time charge based detection of molecules in liquids or gases.
引用
收藏
页码:81 / 84
页数:4
相关论文
共 50 条
  • [31] A monolithically integrated microcantilever biosensor based on partially depleted SOI CMOS technology
    Yi Liu
    Yuan Tian
    Cong Lin
    Jiahao Miao
    Xiaomei Yu
    Microsystems & Nanoengineering, 9
  • [32] Body-charge-induced switching characteristics in fully depleted silicon-on-insulator digital circuits
    Sato, Y
    Ishihara, T
    Kado, Y
    Nishimura, K
    Tsuchiya, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (8A): : 5209 - 5217
  • [33] A 1.8 GHz fully integrated low voltage LC VCO in silicon on sapphire CMOS
    Bhatia, R
    Jalan, U
    Chakraborty, S
    Yoon, SW
    Nuttinck, S
    Pinel, S
    Laskar, J
    33RD EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS, 2003, : 579 - 582
  • [34] Development for Germanium Blocked Impurity Band Far-Infrared Image Sensors with Fully-Depleted Silicon-On-Insulator CMOS Readout Integrated Circuit
    Wada, T.
    Arai, Y.
    Baba, S.
    Hanaoka, M.
    Hattori, Y.
    Ikeda, H.
    Kaneda, H.
    Kochi, C.
    Miyachi, A.
    Nagase, K.
    Nakaya, H.
    Ohno, M.
    Oyabu, S.
    Suzuki, T.
    Ukai, S.
    Watanabe, K.
    Yamamoto, K.
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2016, 184 (1-2) : 217 - 224
  • [35] Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor
    Alj, Antoine Salih
    Touron, Pierre
    Roy, Francois
    Tournier, Arnaud
    Michelot, Julien
    Demiguel, Stephane
    Virmontois, Cedric
    Lalucaa, Valerian
    Magnan, Pierre
    Goiffon, Vincent
    IEEE SENSORS JOURNAL, 2024, 24 (16) : 25652 - 25661
  • [36] Development for Germanium Blocked Impurity Band Far-Infrared Image Sensors with Fully-Depleted Silicon-On-Insulator CMOS Readout Integrated Circuit
    T. Wada
    Y. Arai
    S. Baba
    M. Hanaoka
    Y. Hattori
    H. Ikeda
    H. Kaneda
    C. Kochi
    A. Miyachi
    K. Nagase
    H. Nakaya
    M. Ohno
    S. Oyabu
    T. Suzuki
    S. Ukai
    K. Watanabe
    K. Yamamoto
    Journal of Low Temperature Physics, 2016, 184 : 217 - 224
  • [37] FULLY-INTEGRATED PMOS-BASED CHARGE PUMPS IN STANDARD CMOS PROCESSWITHOUT HIGH-VOLTAGE SWITCHES
    Liu, Jingqi
    Bazzini, Andrea
    Gregori, Stefano
    2012 25TH IEEE CANADIAN CONFERENCE ON ELECTRICAL & COMPUTER ENGINEERING (CCECE), 2012,
  • [38] Development of Low Power Cryogenic Readout Integrated Circuits Using Fully-Depleted-Silicon-on-Insulator CMOS Technology for Far-Infrared Image Sensors
    T. Wada
    H. Nagata
    H. Ikeda
    Y. Arai
    M. Ohno
    K. Nagase
    Journal of Low Temperature Physics, 2012, 167 : 602 - 608
  • [39] A Fully Integrated DAC for CMOS Position-Based Charge Qubits with Single-Electron Detector Loopback Testing
    Esmailiyan, Ali
    Wang, Hongying
    Asker, Mike
    Koskin, Eugene
    Leipold, Dirk
    Bashir, Imran
    Xu, Kai
    Koziol, Anna
    Blokhina, Elena
    Staszewski, R. Bogdan
    IEEE SOLID-STATE CIRCUITS LETTERS, 2020, 3 : 354 - 357
  • [40] Development of Low Power Cryogenic Readout Integrated Circuits Using Fully-Depleted-Silicon-on-Insulator CMOS Technology for Far-Infrared Image Sensors
    Wada, T.
    Nagata, H.
    Ikeda, H.
    Arai, Y.
    Ohno, M.
    Nagase, K.
    JOURNAL OF LOW TEMPERATURE PHYSICS, 2012, 167 (5-6) : 602 - 608