Improved approach to Fowler-Nordheim plot analysis

被引:30
|
作者
Forbes, Richard G. [1 ,2 ]
Fischer, Andreas [3 ]
Mousa, Marwan S. [3 ]
机构
[1] Univ Surrey, Fac Engn & Phys Sci, Adv Technol Inst, Guildford GU2 7XH, Surrey, England
[2] Univ Surrey, Fac Engn & Phys Sci, Dept Elect Engn, Guildford GU2 7XH, Surrey, England
[3] Mutah Univ, Dept Phys, Al Karak 61710, Jordan
来源
关键词
FIELD-EMISSION; ELECTRON-EMISSION; EMITTERS; BARRIER; METALS; AREA;
D O I
10.1116/1.4765080
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article introduces an improved approach to Fowler-Nordheim (FN) plot analysis, based on a new type of intercept correction factor. This factor is more cleanly defined than the factor previously used. General enabling theory is given that applies to any type of FN plot of data that can be fitted using a FN-type equation. Practical use is limited to emission situations where slope correction factors can be reliably predicted. By making a series of well-defined assumptions and approximations, it is shown how the general formulas reduce to provide an improved theory of orthodox FN-plot data analysis. This applies to situations where the circuit current is fully controlled by the emitter characteristics, and tunneling can be treated as taking place through a Schottky-Nordheim (SN) barrier. For orthodox emission, good working formulas make numerical evaluation of the slope correction factor and the new intercept correction factor quick and straightforward. A numerical illustration, using simulated emission data, shows how to use this improved approach to derive values for parameters in the full FN-type equation for the SN barrier. Good self-consistency is demonstrated. The general enabling formulas also pave the way for research aimed at developing analogous data-analysis procedures for nonorthodox emission situations. (C) 2013 American Vacuum Society. [http://dx.doi.org/10.1116/1.4765080]
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页数:8
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