Local analysis of the edge dislocation core in BaTiO3 thin film by STEM-EELS

被引：17
|
作者：
Kurata, H. [1 ]
Isojima, S. [1 ]
Kawai, M. [1 ]
Shimakawa, Y. [1 ]
Isoda, S. [1 ]
机构：
[1] Kyoto Univ, Inst Chem Res, Kyoto 6110011, Japan
来源：
JOURNAL OF MICROSCOPY | 2009年 / 236卷 / 02期
关键词：
BaTiO3; dislocation; EELS; ELNES; HAADF; ELECTRON-ENERGY-LOSS; ATOMIC-SCALE;
D O I：
10.1111/j.1365-2818.2009.03265.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
P>The a < 100 > edge dislocation core formed in an epitaxial BaTiO3 (BTO) thin film grown on a substrate was investigated by scanning transmission electron microscopy combined with electron energy-loss spectroscopy. Elemental analysis using core-loss spectrum indicates that the atomic ratios of O/Ti and Ba/Ti are decreased at the dislocation core. The near-edge fine structure of the oxygen K-edge recorded from the dislocation core differs slightly from that of relaxed BTO region, which suggests that Ba-O bonding is decreased at the dislocation core. The structure of the dislocation core is discussed using a high-angle annular dark-field image and the electron energy-loss spectroscopy results.
引用
收藏
页码：128 / 131
页数：4
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