Special issue on Mutation Testing

被引：3

|

作者：

Papadakis, Mike ^{[1
]}

Just, Rene ^{[2
]}

机构：

[1] Luxembourg Univ, Interdisciplinary Ctr Secur Reliabil & Trust, Luxembourg, Luxembourg

[2] Univ Massachusetts, Coll Informat & Comp Sci, Amherst, MA 01003 USA

来源：

INFORMATION AND SOFTWARE TECHNOLOGY | 2017年 / 81卷

关键词：

D O I：

10.1016/j.infsof.2016.08.003

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：1 / 2

页数：2

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