Special issue on mutation testing and analysis

被引：0

|

作者：

Just, Rene ^{[1
]}

Krinke, Jens ^{[2
]}

Li, Nan ^{[3
]}

Rojas, Jose Miguel ^{[4
]}

机构：

[1] Univ Washington, Seattle, WA 98195 USA

[2] UCL, London, England

[3] Medidata Solut, New York, NY USA

[4] Univ Leicester, Leicester, Leics, England

来源：

SOFTWARE TESTING VERIFICATION & RELIABILITY | 2019年 / 29卷 / 1-2期

关键词：

D O I：

10.1002/stvr.1697

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

引用

收藏

页数：3

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