Energetics and bias-dependent scanning tunneling microscopy images of Si ad-dimers on Ge(001)

被引:14
|
作者
Khare, SV [1 ]
Kulkarni, RV [1 ]
Stroud, D [1 ]
Wilkins, JW [1 ]
机构
[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 07期
关键词
D O I
10.1103/PhysRevB.60.4458
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report an ab initio study of the energetics and scanning tunneling microscopy (STM) images of Si ad-dimers on Ge(001) and energetics of Ge ad-dimers on Si(001). As in the case of Si dimers on Si(001), we find for both systems that the D dimer configuration, lying between the substrate dimer rows and parallel to them, is highest in energy. Conversely, recent STM experiments for Si ad-dimers on Ge(001) deduce the D configuration to be most stable. Our theoretical STM images for this system find that both the D and C configurations (the latter also between the rows) have similar STM images for the experimental voltages. We propose an experimental test (low-bias STM imaging) which would unambiguously distinguish between the D and C configurations. [S0163-1829(99)04631-7].
引用
收藏
页码:4458 / 4461
页数:4
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