Control Chart for Monitoring Dependent Binomial Processes

被引：0
|
作者：
Kuo, Tsen-, I [1 ]
Lin, Cheng-Shih [1 ]
Chen, Tung-Tsan [2 ]
Hung, Hsin-Hua [3 ]
机构：
[1] Natl Quemoy Univ, Dept Business Adm, Kinmen, Taiwan
[2] Natl Quemoy Univ, Dept Civil Engn & Engn Management, Kinmen, Taiwan
[3] Natl Quemoy Univ, Grad Inst Isl Recreat Resource, Kinmen, Taiwan
来源：
2011 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM) | 2011年
关键词：
Statistical process control; attribute control chart; correlation binomial model; average run length; CORRELATED PROCESSES;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Many processes data are autocorrelated, and traditional methods may lead to false results. Hence, traditional methods are not appropriate. Attribute control charts for monitoring dependent processes are lacking. Hence, we will investigate attribute control charts for monitoring dependent binomial processes in this study. We evaluate the performance of attribution control charts for monitoring dependent processes by average run length.
引用
收藏
页码：1335 / 1337
页数：3
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