On Statistical Design of the Cumulative Quantity Control Chart for Monitoring High Yield Processes

被引:9
|
作者
Chen, Pei-Wen [1 ]
Cheng, Chuen-Sheng [1 ]
机构
[1] Yuan Ze Univ, Dept Ind Engn & Management, Tao Yuan 320, Taiwan
关键词
ARL-unbiased; CQC chart; High yield process; Runs rules; RELIABILITY; QUALITY;
D O I
10.1080/03610920903391329
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
When dealing with high-yield processes, the cumulative quantity control chart (CQC chart) has been shown to be more suitable than the traditional c chart and u chart. However, the CQC chart shows an ARL-biased performance. In this article, we propose a design procedure to derive modified control limits for the CQC chart and the CQC chart with runs rules that can produce ARL-unbiased performance and maintain the predetermined false alarm rate. After extensive numerical work we have found that the proposed ARL-unbiased CQC chart is more sensitive than the conventional CQC chart in detecting process deteriorations.
引用
收藏
页码:1911 / 1928
页数:18
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