Interferometric metrology of conformal domes

被引：4
|
作者：
Lerner, SA [1 ]
Sasian, JM [1 ]
Greivenkamp, JE [1 ]
Gappinger, RO [1 ]
Clark, SR [1 ]
机构：
[1] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
来源：
WINDOW AND DOME TECHNOLOGIES AND MATERIALS VI | 1999年 / 3705卷
关键词：
D O I：
10.1117/12.354626
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：221 / 226
页数：6
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