Interferometric metrology of conformal domes

被引：4
|
作者：
Lerner, SA [1 ]
Sasian, JM [1 ]
Greivenkamp, JE [1 ]
Gappinger, RO [1 ]
Clark, SR [1 ]
机构：
[1] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
来源：
WINDOW AND DOME TECHNOLOGIES AND MATERIALS VI | 1999年 / 3705卷
关键词：
D O I：
10.1117/12.354626
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：221 / 226
页数：6
相关论文
共 50 条
  • [1] Manufacturing and metrology for IR conformal windows and domes
    Ferralli, Ian
    Blalock, Todd
    Brunelle, Matt
    Lynch, Timothy
    Myer, Brian
    Medicus, Kate
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS XV, 2017, 10179
  • [2] Interferometric Tomography Metrology of Conformal Optics
    Gutin, Mikhail
    Gutin, Olga
    Wang, Xu-Ming
    Ehlinger, Dennis
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS XIII, 2013, 8708
  • [3] Interferometric Tomography - a New Tool for Metrology on Conformal Optics
    Gutin, Mikhail
    Gutin, Olga
    Wang, Xu-Ming
    Ehlinger, Dennis
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS XII, 2011, 8016
  • [4] Advances in interferometric metrology
    Wyant, JC
    [J]. OPTICAL DESIGN AND TESTING, 2002, 4927 : 154 - 162
  • [5] Developments in the finishing of domes and conformal optics
    Shorey, Aric B.
    Kordonski, William
    Tracy, Justin
    Tricard, Marc
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS X, 2007, 6545
  • [6] Grinding and Polishing of Conformal Windows and Domes
    Fess, Edward
    Ross, James
    Matthews, Greg
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS XV, 2017, 10179
  • [7] High precision metrology of domes and aspheric optics
    Murphy, PE
    Fleig, J
    Forbes, G
    Tricard, M
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS IX, 2005, 5786 : 112 - 121
  • [8] Traceability in Interferometric Form Metrology
    Schulz, M.
    Blobel, G.
    Fortmeier, I.
    Stavridis, M.
    Elster, C.
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX, 2015, 9525
  • [9] Deterministic, precision finishing of domes and conformal optics
    Shorey, A
    Kordonski, W
    Tricard, M
    [J]. WINDOW AND DOME TECHNOLOGIES AND MATERIALS IX, 2005, 5786 : 310 - 318
  • [10] Applications of optical coherence in interferometric metrology
    de Groot, Peter J.
    [J]. SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2018, 10834
12345